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Elsevier

Advanced Laser Diode Reliability

  • 1st Edition - July 13, 2021
  • Latest edition
  • Authors: Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda, Giovanna Mura
  • Language: English

Advanced Laser Diode Reliability focuses on causes and effects of  degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical m… Read more

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Description

Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.

Key features

  • Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda
  • Present the extension to new failure mechanisms, new technologies, new application fields, new environments
  • Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities

Readership

Scientists and engineers working in Reliability of Photonic Devices and Students of advanced academic courses on Photonics and Reliability

Table of contents

1. Laser Diode Reliability

2. Multi-Component Model for Semiconductor Laser Degradation

3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions

4. Laser Diode Characteristics

5. Laser Diode DC Measurement Protocols

Product details

  • Edition: 1
  • Latest edition
  • Published: July 13, 2021
  • Language: English

About the authors

MV

Massimo Vanzi

Massimo Vanzi is Full Professor of Electronics at the University of Cagliari, Italy. Previously, he worked for 14 years at the Italian telecom company, Telettra, in the Quality and Reliability Department. His research focuses on general reliability, failure physics and diagnostics of solid state devices
Affiliations and expertise
Proffessor, University Cagliari, Italy

LB

Laurent Bechou

Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.
Affiliations and expertise
Université de Sherbrooke

MF

Mitsuo Fukuda

Mitsuo Fukuda is Senior Researcher and Professor Emeritus studying plasmonic devices at the Toyohashi University of Technology, Japan. Previously, he was a researcher studying optical semiconductor devices used for various optical fiber communication systems at the NTT Electrical Communication Laboratories.
Affiliations and expertise
Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Japan

GM

Giovanna Mura

Giovanna Mura is Assistant Professor at the University of Cagliari. Her research is mainly focused on failure physics, diagnostics of microelectronics by electron microscopy (SEM and TEM) and general methods for reliability with a special emphasis on photonic devices.
Affiliations and expertise
Assistant Professor, University Cagliari, Italy

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