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Advances in Imaging and Electron Physics

  • 1st Edition, Volume 197 - October 14, 2016
  • Latest edition
  • Author: Peter W. Hawkes
  • Language: English

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The ser… Read more

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Description

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key features

  • Contains contributions from leading authorities on imaging and electron physics that inform and update on the latest developments in the field
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of contents

  • Preface
  • Future Contributions
  • Chapter One: Interference of Light and of Material Particles: A Departure from the Superposition Principle
    • Abstract
    • 1 Introduction
    • 2 Theoretical Model
    • 3 Particle Interference Described with the Novel Model
    • 4 Interpretation of Electron Interference
    • 5 Interpretation of Massive Molecule Interference
    • 6 Perspectives in the Realization of Molecular Nanostructures
    • 7 Conclusions
    • Acknowledgments
    • Appendix 1 The Size of the Structured Supports of Spatial Coherence
    • Appendix 2 Nonparaxial Far-Field Interference of Light
  • Chapter Two: Unified Numerical Formalism of Modal Methods in Computational Electromagnetics and the Latest Advances: Applications in Plasmonics
    • Abstract
    • 1 Introduction
    • 2 From Maxwell Equations to Modal Equations
    • 3 Method of Moment and Operator Representation
    • 4 FMM in the Cartesian Coordinate System
    • 5 From Subsectional to Global Basis Functions
    • 6 Anisotropic Impedance Matched Media and Their Equivalence With Complex Coordinates
    • 7 Application: Modal Analysis of the Coupling Between a Square Ring Resonator and a Metal–Insulator–Metal Waveguide
    • 8 About Monomode Behavior of a More Realistic 3D Plasmonic Open Waveguide
  • Chapter Three: Fundamentals of Focal Series Inline Electron Holography
    • Abstract
    • 1 Introduction
    • 2 Thin Lens Imaging
    • 3 Experimental Implementation
    • 4 Long-Range Focal Series Reconstruction
    • 5 Case Study
    • 6 Summary and Outlook
    • Acknowledgments
    • Appendix
  • Index
  • Contents of Volumes 151-196

Product details

  • Edition: 1
  • Latest edition
  • Volume: 197
  • Published: October 14, 2016
  • Language: English

About the author

PH

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

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