Advances in Imaging and Electron Physics

Chapter One: Micro-XRF in Scanning Electron Microscopes

• Abstract
• 1 Introduction
• 2 Differences and Synergies of SEM-EDS and μ-XRF
• 3 Design of an Microspot X-Ray Source for SEM
• 4 Performing a Measurement
• 5 Applications
• 6 Summary

Chapter Two: A Variational Approach for Simulation of Equilibrium Ion Distributions in Ion Traps With Regard to Coulomb Interaction

• Abstract
• 1 Introduction
• 2 Physical Grounds of the Simulation Method
• 3 Simulation Results
• 4 Conclusion
• Acknowledgment

Chapter Three: Analytical Review of Direct Stem Imaging Techniques for Thin Samples

• Abstract
• 1 Introduction
• 2 Linear CBED COM STEM Imaging Techniques
• 3 STEM Imaging Techniques Using a Symmetric Scalar Detector
• 4 STEM Imaging Using an Antisymmetric Vector Detector: iDPC
• 5 Experimental Results Using iDPC-STEM Imaging
• 6 Summary and Conclusions
• Acknowledgments
• Appendix A Resolution of STEM Imaging
• Appendix B Derivation of the Ideal, Linear COM STEM Vector Image Formation Formula
• Appendix C Derivation of the General, Nonlinear STEM Image Formation Formula
• Appendix D CTFs for Aberration-Free MIDI-STEM
• Appendix E Determination of the Scaling Factors in the Fourier Series in Azimuthal Direction for Wedge-Shaped DPC Detectors
• Appendix F CTF_iS and CTF_iC for the COM-STEM Detector
• Appendix G List of Abbreviations

Chapter Four: Quantum Nanooptics in the Electron Microscope

• Abstract
• 1 Introduction
• 2 Quantum Optics
• 3 Primary Excitations in Bulk and Quantum-Confined Materials
• 4 CL Phenomenon
• 5 Single-Photon Detection in the Electron Microscope
• 6 Light Bunching in CL
• 7 Lifetime Measurements at the Nanometer Scale
• 8 Perspectives
• Acknowledgments

Chapter Five: Component Identification and Interpretation: A Perspective on Tower of Knowledge

• Abstract
• 1 Introduction
• 2 Component Identification by a Voting Method
• 3 Component Interpretation by ToK
• 4 Conclusions