Embedded Mechatronic Systems
Analysis of Failures, Predictive Reliability
- 2nd Edition - November 15, 2019
- Latest edition
- Editors: Abdelkhalak El Hami, Philippe Pougnet
- Language: English
Mechatronics brings together computer science, mechanics and electronics. It enables us to improve the performances of embedded electronic systems by reducing their weight, vo… Read more
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Description
Description
Mechatronics brings together computer science, mechanics and electronics. It enables us to improve the performances of embedded electronic systems by reducing their weight, volume, energy consumption and cost. Mechatronic equipment must operate without failure throughout ever-increasing service lives.The particularly severe conditions of use of embedded mechatronics cause failure mechanisms which are the source of breakdowns. Until now, these failure phenomena have not been looked at with enough depth to be able to be controlled.
Key features
Key features
- Provides a statistical approach to design optimization through reliability
- Presents an experimental approach for the characterization of the development of mechatronic systems in operating mode
- Analyzes new tools that effect thermal, vibratory, humidity, electric and electromagnetic stresses
Readership
Readership
Table of contents
Table of contents
Philippe Pougnet and Hichame Maanane
2. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices
Pierre Richard Dahoo, Malika Khettab, Jorge Linares and Philippe Pougnet
3. Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities
Samh Khemiri, Abhishek Ramanujan, Moncef Kadi and Zouheir Riah
4. Metrology of Static and Dynamic Displacements and Deformations Using Full-Field Techniques
Ioana Nistea and Dan Borza
5. Characterization of Switching Transistors under Electrical Overvoltage Stresses
Patrick Martin, Ludovic Lacheze, Alain KamdeL and Philippe Descamps
6. Reliability OF Radio Frequency Power Transistors to Electromagnetic and Thermal Stress
Samh Khemiri and Moncef Kadi
7. Internal Temperature Measurement of Electronic Components
Eric Joubert, Olivier Latry, Pascal Dherbecourt, Maxime Fontaine, Christian Gautier, Hubert Polaert and Philippe Eudeline
8. Reliability Prediction of Embedded Electronic Systems: the FIDES Guide
Philippe Pougnet, Franck Bayle, Hichame Maanane and Pierre Richard Dahoo
9. Study of the Dynamic Contact Between Deformable Solids
Bouchaïb Radi and Abdelkhalak El Hami
Product details
Product details
- Edition: 2
- Latest edition
- Published: November 15, 2019
- Language: English
About the editors
About the editors
AE
Abdelkhalak El Hami
PP