Encyclopedia of Materials Characterization
Surfaces, Interfaces, Thin Films
- 1st Edition - August 18, 1992
- Latest edition
- Authors: Charles Evans, Richard Brundle, Wilson
- Language: English
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin… Read more
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Description
Description
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.
Table of contents
Table of contents
Imaging Techniques, Elemental, Chemical, and Structural Analysis in Electron Beam Column Instruments, Structure Determination by Electron/X-Ray Diffraction/Scattering, Electron Emission Spectroscopies, X-Ray Absorption and Emission Spectroscopies, Visible/UV Emission nad Reflection, Vibrational Spectroscopies and NMR, Ion Scattering Techniques, Mass Spectroscopy and Optical Techniques, Neutron and Nuclear Techniques, Physical and Magnetic Properties
Product details
Product details
- Edition: 1
- Latest edition
- Published: October 22, 2013
- Language: English
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