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Particles and Waves in Electron Optics and Microscopy

  • 1st Edition, Volume 194 - May 27, 2016
  • Latest edition
  • Editor: Peter W. Hawkes
  • Language: English

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The ser… Read more

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Description

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key features

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates all the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Table of contents

  • Dedication
  • Foreword
  • Preface
  • Future Contributions
  • Acknowledgments
    • Credits
  • Plan of the Book
  • Chapter One: Complements of Geometrical Light Optics
    • Abstract
    • 1 Geometry of the Rays
    • 2 Geometry of the Surfaces
    • 3 Comments and Notes
  • Chapter Two: Complements of Wave Optics
    • Abstract
    • 1 Mathematical Preliminaries
    • 2 Elements of Diffraction Theory: Propagation
    • 3 Elements of Diffraction Theory: Interaction
    • 4 Kirchhoff Diffraction from a Half-plane and Comparison with the Sommerfeld Solution
    • 5 Comments and Notes
  • Chapter Three: Particle Theory of Image Formation
    • Abstract
    • 1 Elementary Considerations
    • 2 Expressions for the Electric and Magnetic Fields
    • 3 Electron Focusing in Cylindrical Coordinates
    • 4 Image Formation: The General Case
    • 5 Motion in Perpendicular and Crossed Fields
  • Chapter Four: Electromagnetic Lenses
    • Abstract
    • 1 Electrostatic Lenses
    • 2 Magnetic Lenses
    • 3 Quadrupole Lenses
    • 4 Comments and Notes
  • Chapter Five: Electron, Particles, or Waves?
    • Abstract
    • 1 The Electron Biprism
    • 2 Experimental Results with the Electron Biprism
    • 3 Buildup of the Biprism Fresnel Interference Fringes by Single Electrons
    • 4 Experiments with Nanoslits
    • 5 Buildup of the Two-Slit Fraunhofer Interference Fringes by Single Electrons
    • 6 Comments and Notes
  • Chapter Six: The Wavefunction of the Paraxial Electrons
    • Abstract
    • 1 The Schrödinger Equation
    • 2 The Eikonal Approximation
    • 3 Electron–Specimen Interaction: The Phase Object Approximation
    • 4 The Multislice Approximation
    • 5 Comparison Between the Two Approaches
    • 6 Comments and Notes
  • Chapter Seven: Fourier Optics
    • Abstract
    • 1 Relationship Between the Wavefunctions in the Object and Image Planes
    • 2 A Note on the Dirac δ Function
    • 3 Effect of an Aperture on the Image
    • 4 Influence of the Aperture on the Image of a Periodic Object
    • 5 Evolution of the Wavefunction in a Thin Lens
    • 6 From Wave to Particle Mechanics
    • 7 Comments and Notes
  • Chapter Eight: Other Interference Experiments
    • Abstract
    • 1 Multiple Beam Experiments
    • 2 Interference of Probability Amplitudes
    • 3 The Magnetic Aharonov–Bohm Effect
    • 4 The Electrostatic Aharonov–Bohm Effect
    • 5 Comments and Notes
  • Chapter Nine: Interpretation of the Experimental Results
    • Abstract
    • 1 The Wavefunction in the Observation Plane
    • 2 Spherical Wave Theorems
    • 3 Slits
    • 4 Electron Biprism
    • 5 Interference of the Probability Amplitudes
    • 6 Interpretation of the Aharonov–Bohm Effects
    • 7 Linear Charge Distributions
    • 8 Comments and Notes
  • Chapter Ten: Off-Axis Electron Holography: A Short Introduction
    • Abstract
    • 1 Gabor's Idea
    • 2 Electron Holography: Early State of the Art
    • 3 Electron Holography of Long-Range Electromagnetic Fields
    • 4 Simulation of the Holographic Process for a Magnetized Bar
    • 5 Comments and Notes
  • Chapter Eleven: Waveoptical Analysis of the Spherical Aberration
    • Abstract
    • 1 Beyond the Paraxial Approximation
    • 2 Phase Object Approximation with Spherical Input Waves
    • 3 Equation for the Spherical Aberration Coefficient
    • 4 The Wide-Angle Parabolic Wave Equation
    • 5 Solution of the Wide-Angle Parabolic Equation
    • 6 Comparison with the Classical Results
    • 7 The Scherzer Theorem for Magnetic Lenses
    • 8 Amplitude Transfer Theory
    • 9 The Point Transfer Function
    • 10 Phase Contrast in the STEM
    • 11 Comments and Notes
  • Chapter Twelve: Epilogue
  • Appendix: Calculation of the Definite Integrals Appearing in the R–S Formula
  • Bibliography
  • Contents of Volumes 151-193
  • Index

Product details

  • Edition: 1
  • Latest edition
  • Volume: 194
  • Published: May 27, 2016
  • Language: English

About the editor

PH

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

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