Skip to main content

Physics of Thin Films

Advances in Research and Development

  • 1st Edition - December 28, 1987
  • Latest edition
  • Editors: Maurice H. Francombe, John L. Vossen
  • Language: English

Physics of Thin Films: Advances in Research and Development primarily deals with the influence of ions or optical energy on the deposition, properties, and etching on thin films.… Read more

World Book Day celebration

Where learning shapes lives

Up to 25% off trusted resources that support research, study, and discovery.

Description

Physics of Thin Films: Advances in Research and Development primarily deals with the influence of ions or optical energy on the deposition, properties, and etching on thin films. The book is a collection of five articles, with one article per chapter. Chapter 1 covers ionized cluster beam deposition; epitaxy; and film-formation mechanism. Chapter 2 discusses the activated reactive evaporation process; the deposition of refractory compounds; the role of plasma in the process; and its applications. Chapter 3 focuses on ion-beam processing of optical thin films; ion sources and ion-surface interactions; and the different kinds of bombardment involved. Chapter 4 deals with laser induced etching - its mechanisms, methods, and applications. Chapter 5 talks about contacts to GaAs devices; Fermi-level pinning; and heterojunction contacts. The book is recommended for physicists and engineers in the field of electronics who would like to know more about thin films and the progresses in the field.

Table of contents


Contents

Contributors to Volume 13 v

Preface

Editors' Note

Ionized Cluster Beam Deposition and Epitaxy

I. Introduction

II. Equipment for Ionized Cluster Beam Deposition and Epitaxy

III. Film-Formation Mechanism

IV. Film Deposition and Epitaxial Growth

V. Conclusions

References

The Activated Reactive Evaporation Process

I. Introduction

II. Processes for the Deposition of Refractory Compounds

III. Direct Evaporation

IV. Reactive Evaporation Processes

V. Activated Reactive Evaporation and the Role of Plasma

VI. Implementation of the Activated Reactive Evaporation Process

VII. Compounds Synthesized by the ARE Process and the Effect of Process Variables

VIII. Microstructure, Preferred Orientation, and Mechanical Properties of Refractory Compound Deposits

IX. Applications of the ARE Process

X. Summary

References

Ion-Beam Processing of Optical Thin Films

I. Introduction

II. Ion Sources

III. Ion-Surface Interactions

IV. Film Properties and Analysis Method

V. Substrate Bombardment

VI. Postdeposition Bombardment

VII. Ion-Beam Deposition of Optical Films

VIII. Conclusion

References

Laser-Induced Etching

I. Introduction

II. Mechanisms of Laser-Induced Etching

III. Methods of Laser-Induced Etching

IV. Applications of Laser-Induced Etching

V. Concluding Remarks

References

Contacts to GaAs Devices

I. Introduction

II. "Ideal" Contacts

III. The GaAs Surface and InterfaceFermi-Level Pinning

IV. Alloyed Ohmic Contacts to GaAs

V. Heterojunction Contacts

VI. Recent Results

VII. Summary

References

Author Index

Subject Index

Product details

  • Edition: 1
  • Latest edition
  • Published: October 22, 2013
  • Language: English

View book on ScienceDirect

Read Physics of Thin Films on ScienceDirect