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Principles of Semiconductor Network Testing

  • 1st Edition - June 5, 1995
  • Latest edition
  • Author: Amir Afshar
  • Language: English

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help… Read more

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Description

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Key features

  • Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
  • Best new source of information for experienced semiconductor engineers as well as entry-level personnel
  • Eight chapters about semiconductor testing

Readership

Semiconductor design and test engineers

Table of contents

Diode and transistor operationIntegrated circuit test basicsDigital logic testNoise identificationOperational amplifier general informationData acquisition devicesDigital signal processingCODEC (Coder/Decoder)

Product details

  • Edition: 1
  • Latest edition
  • Published: April 22, 1996
  • Language: English

About the author

AA

Amir Afshar

Affiliations and expertise
National Semiconductor

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