Reliability, Robustness and Failure Mechanisms of LED Devices
Methodology and Evaluation
- 1st Edition - September 23, 2016
- Latest edition
- Authors: Yannick Deshayes, Laurent Bechou
- Language: English
The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such te… Read more
Data Mining & ML
Unlock the cutting edge
Up to 20% on trusted resources. Build expertise with data mining, ML methods.
Description
Description
The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.
Key features
Key features
- Deals exclusively with reliability, based on the physics of failure for infrared LEDs
- Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications
- Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution
- Focuses on the method to extract fundamental parameters from electrical and optical characterizations
Readership
Readership
Practitioners and engineers, small and mid-sized enterprises; postgraduate students, academics, and researchers
Table of contents
Table of contents
- Preface
- 1: State-of-the-Art of Infrared Technology
- Abstract
- 1.1 Introduction
- 1.2 Compound materials III-V
- 1.3 Light-emitting diodes
- 1.4 Applications
- 1.5 Conclusion
- 2: Analysis and Models of an LED
- Abstract
- 2.1 Introduction
- 2.2 Physicochemical analysis
- 2.3 Electro-optical analysis
- 2.4 Initial characterizations of 935 nm LEDs
- 2.5 Conclusion
- 3: Physics of Failure Principles
- Abstract
- 3.1 Introduction
- 3.2 Aging tests
- 3.3 Failure signatures
- 3.4 Physics of failures
- 3.5 Conclusion
- 4: Methodologies of Reliability Analysis
- Abstract
- 4.1 Introduction
- 4.2 Method based on the physics of failures
- 4.3 Digital methods
- 4.4 A new approach
- 4.5 Conclusion
- Bibliography
- Index
Product details
Product details
- Edition: 1
- Latest edition
- Published: September 26, 2016
- Language: English
About the authors
About the authors
YD
Yannick Deshayes
LB