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Sparse-Dirac Super-Resolution (S-Dirac SR) for High-Resolution Transmission Electron Microscopy Techniques

  • 1st Edition, Volume 240 - October 1, 2026
  • Latest edition
  • Editor: Martin Hÿtch
  • Language: English

Sparse-Dirac Super-Resolution (S-Dirac SR) for High-Resolution Transmission Electron Microscopy Techniques, Volume 240 in the Advances in Imaging and Electron Physics seri… Read more

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Description

Sparse-Dirac Super-Resolution (S-Dirac SR) for High-Resolution Transmission Electron Microscopy Techniques, Volume 240 in the Advances in Imaging and Electron Physics series, continues the tradition of this long-standing publication in presenting authoritative reviews and advances in imaging science and electron physics. The series merges two influential serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy—and covers topics spanning electron device physics, particle optics, microlithography, image science, digital image processing, electromagnetic wave propagation, and electron microscopy.

This volume focuses on the development and applications of the Sparse-Dirac super-resolution (S-Dirac SR) method for high-resolution transmission electron microscopy (HRTEM). Chapters present the historical context and motivations behind the method, followed by discussions of its physical principles, mathematical framework, and algorithmic implementation. Additional sections compare the S-Dirac approach with other state-of-the-art techniques and explore its practical applications in high-resolution electron microscopy. The volume concludes with perspectives on future developments and potential directions in super-resolution imaging methods.

Key features

  • Provides an in-depth exploration of the Sparse-Dirac super-resolution (S-Dirac SR) method for high-resolution transmission electron microscopy
  • Presents the physical principles, mathematical framework, and algorithmic implementation of a modern super-resolution imaging technique
  • Includes comparisons with other state-of-the-art imaging and reconstruction approaches
  • Explores practical applications of super-resolution methods in advanced electron microscopy
  • Serves as a valuable reference for researchers in imaging science, electron microscopy, and computational imaging

Readership

Physicists, electrical engineers, applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of contents

1. Introduction: Goals and Historical Context

2. Physical Basis of the S-Dirac Super-Resolution Method

3. Mathematical Framework of the S-Dirac Super-Resolution Method

4. The S-Dirac Super-Resolution Algorithm Step by Step

5. The S-Dirac Super-Resolution Method versus Complementary State-of-the-Art Techniques

6. Applications of the S-Dirac Super-Resolution Method

7. Conclusion and Perspectives

Product details

  • Edition: 1
  • Latest edition
  • Volume: 240
  • Published: October 1, 2026
  • Language: English

About the editor

MH

Martin Hÿtch

Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Affiliations and expertise
Senior Scientist, French National Centre for Research (CNRS), Toulouse, France