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Surface Science Techniques

  • 1st Edition - October 5, 1994
  • Latest edition
  • Editors: J.M. Walls, Robin Smith
  • Language: English

This volume provides a comprehensive and up to the minute review of the techniques used to determine the nature and composition of surfaces. Originally published as a special issue… Read more

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Description

This volume provides a comprehensive and up to the minute review of the techniques used to determine the nature and composition of surfaces. Originally published as a special issue of the Pergamon journal Vacuum, it comprises a carefully edited collection of chapters written by specialists in each of the techniques and includes coverage of the electron and ion spectroscopies, as well as the atom-imaging methods such as the atom probe field ion microscope and the scanning tunnelling microscope.

Surface science is an important area of study since the outermost surface layers play a crucial role in processses such as catalysis, adhesion, wear, and corrosion, with applications in metallurgy, thin films and surface coatings, the chemicals and polymer industries, and microelectronics, to name a few. This book covers those techniques used routinely for surface analysis as well as those employed for more fundamental scientific studies. It will be of interest to university research workers, graduate students and to industrial scientists solving practical problems.

Readership

For university research workers, graduate students and industrial scientists solving practical problems.

Table of contents

Foreward. Surface science techniques (H.M. Walls).X-ray photoelectron spectroscopy (J.F. Watts). Auger electron spectroscopy (C.H. Linsmeier). X-ray absorption fine structure for surface studies (M.D. Crapper). Surface infrared spectroscopy (P. Hollins). Angle-resolved UV -photoelectron spectroscopy (H.-P. Steinrück). Ballistic simulation in surface science (R. Smith, G. Body). Secondary ion mass spectrometry (P.C. Zalm). Ion scattering spectroscopy (M.P. Murrell). Rutherford backscattering and nuclear reaction analysis (L.G. Earwaker). Scanning tunnelling microscopy (I.H. Wilson). Atom probe field ion microscopy (M.K. Miller). Index.

Product details

  • Edition: 1
  • Latest edition
  • Published: October 5, 1994
  • Language: English

About the editor

RS

Robin Smith

Dr Ray Smith is a senior lecturer in the Materials Department at Queen Mary University of London.
Affiliations and expertise
Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA 93106-9560, USA