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Elsevier

The Spectroscopy of Semiconductors

  • 1st Edition, Volume 36 - July 7, 1992
  • Latest edition
  • Editors: R. K. Willardson, Christopher L. Littler, Eicke R. Weber, David G. Seiler, Albert C. Beer
  • Language: English

Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic… Read more

Description

Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today's semiconductor structures.

Key features

@introbul:Key Features@bul:* Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors* Features detailed review articles which cover basic principles* Highlights specific applications such as the use of laser spectroscopy for the characterization of GaAs quantum well structures

Readership

Electrical engineers, materials scientists, physicists, and industrial scientists, particularly researchers and technicians in the semiconductor industry.

Table of contents

D. Heiman, Laser Spectroscopy of Semiconductors at Low Temperatures and High Magnetic Fields. A.V. Nurmikko, Transient Spectroscopy by Ultrashort Laser Pulse Techniques. A.K. Ramdas and S. Rodriguez, Piezospectroscopy of Semiconductors. O.J. Glembocki and B.V. Shanabrook, Photoreflectance Spectroscopy of Microstructures. D.G. Seiler, C.L. Littler, and M.H. Weiler, One- and Two-Photon Magneto-Optical Spectroscopy of InSb and Hg1-xCdxTe. Each chapter includes references. Index.

Product details

  • Edition: 1
  • Latest edition
  • Volume: 36
  • Published: July 7, 1992
  • Language: English

About the editors

RW

R. K. Willardson

Affiliations and expertise
WILLARDSON CONSULTING SPOKANE, WASHINGTON

CL

Christopher L. Littler

Affiliations and expertise
University of North Texas

EW

Eicke R. Weber

Affiliations and expertise
Fraunhofer-Institut für Solare Energiesysteme ISE, Freiburg, Germany

DS

David G. Seiler

Affiliations and expertise
National Institute of Standards and Technology

AB

Albert C. Beer

Affiliations and expertise
CONSULTING PHYSICIST COLUMBUS, OHIO

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